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Published Articles >> Table of Contents >> Abstract
Summer 1996 (Vol. 13, No. 2)
pp. 34-41
Real-Time Current Testing for A/D Converters
Yukiya Miura
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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.500199
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| Abstract |
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This article describes a method for testing A/D converters using current testing. This method achieves real-time current testing without any need to analyze the results of testing. We also examine the effectiveness of fault detection by current testing combined with variable power supply voltage testing. The current testing used in this article measures the integral of the power supply current during one clock period when a test vector is applied. The target circuit is a 2-bit CMOS A/D converter and target faults are resistive bridging faults and resistive-capacitive breaking faults. Simulation results show that a step-voltage input stimulus is effective for detecting these faults in the A/D converter because this input stimulus allows the current to be measured at discrete time intervals. Moreover, in a variable power supply voltage environment, fault detection by current testing becomes easier as the power supply voltage becomes higher.
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 References
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[1] P.P. Fasang, "Analog/Digital ASIC Design for Testability," IEEE Trans. Industrial Electronics, Vol. 36, No. 2, May 1989, pp. 219-226
[2] A.F. Alani, G. Musgrave, and A.P. Ambler, "A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits," Proc. Int'l Test Conf., IEEE Computer Society Press, Los Alamitos, Calif., 1992, pp. 415-421.
[3] J. Doernberg, H.-S. Lee, and D.A. Hodges, "Full-Speed Testing of A/D Converters," IEEE J. Solid-State Circuits, Vol. 19, No. 6, Dec. 1984, pp. 820-827.
[4] G.N. Stenbakken and T.M. Souders, "Linear Error Modeling of Analog and Mixed-Signal Devices," Proc. Int'l Test Conf., IEEE CS Press, 1991, pp. 573-581.
[5] J.M. Soden et al., "IDDQTesting: A Review," J. Electronic Testing: Theory and Application, Vol. 3, No. 4, Dec. 1992, pp. 291-303.
[6] Y. Miura and K. Kinoshita, "Circuit Design for Built-in Current Testing," Proc. Int'l Test Conf., IEEE CS Press, 1992, pp. 873-881.
[7] Y. Miura and S. Naito, "A Built-in IDDQTest Circuit Utilizing Upper and Lower Limits," Proc. Asian Test Symp., IEEE CS Press, 1994, pp. 138-143.
[8] N. Weste and K. Eshraghian, Principles of CMOS VLSI Design, Addison-Wesley, 1994.
[9] J.S. Beasley et al., "IDDPulse Response Testing of Analog and Digital CMOS Circuits," Proc. Int'l Test Conf., IEEE CS Press, 1993, pp. 626-634.
[10] G. Gielen, Z. Wang, and W. Sansen, "Fault Detection and Input Stimulus Determination for the Testing of Analog Integrated Circuits Basedon Power-Supply Current Monitoring," Proc. Int'l Conf. Computer-Aided Design, IEEE CS Press, 1994, pp. 495-498.
[11] H. Hao and E.J. McCluskey, "Very-Low Voltage Testing for Weak CMOS Logic ICs," Proc. Int'l Test Conf. (ITC 93), IEEE Press, 1993, pp. 275-284.
[12] E. Bruls, "Variable Supply Voltage Testing for Analogue CMOS and Bipolar Circuits," Proc. Int'l Test Conf., IEEE CS Press, 1994, pp. 562-571.
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 Additional Information
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Index Terms- Current testing, Real-time testing, A/D converters, Input stimuli
Citation:
Yukiya Miura,
"Real-Time Current Testing for A/D Converters,"
IEEE Design and Test of Computers,
vol. 13,
no. 2,
pp. 34-41,
Summer,
1996
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