Donald Staab, Eugene R. Hnatek,
"Diagnosing IC Failures in a Fast Environment,"
IEEE Design and Test of Computers, vol. 14, no. 3, pp. 70-75, July-September, 1997.
BibTex
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@article{
10.1109/54.606000, author = {Donald Staab and Eugene R. Hnatek}, title = {Diagnosing IC Failures in a Fast Environment}, journal ={IEEE Design and Test of Computers}, volume = {14}, number = {3}, issn = {0740-7475}, year = {1997}, pages = {70-75}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.606000}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - MGZN JO - IEEE Design and Test of Computers TI - Diagnosing IC Failures in a Fast Environment IS - 3 SN - 0740-7475 SP70 EP75 EPD - 70-75 A1 - Donald Staab, A1 - Eugene R. Hnatek, PY - 1997 VL - 14 JA - IEEE Design and Test of Computers ER -
Failure analysts no longer can wait till defective products come back from the field. Today, they must take a proactive role, detecting failures before they occur and helping designers eliminate their causes.
Citation:
Donald Staab, Eugene R. Hnatek, "Diagnosing IC Failures in a Fast Environment," IEEE Design and Test of Computers, vol. 14, no. 3, pp. 70-75, Jul-Sept, 1997
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