Anshuman Chandra, Krishnendu Chakrabarty,
"Test Resource Partitioning for SOCs,"
IEEE Design and Test of Computers, vol. 18, no. 5, pp. 80-91, September/October, 2001.
BibTex
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@article{
10.1109/54.953275, author = {Anshuman Chandra and Krishnendu Chakrabarty}, title = {Test Resource Partitioning for SOCs}, journal ={IEEE Design and Test of Computers}, volume = {18}, number = {5}, issn = {0740-7475}, year = {2001}, pages = {80-91}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.953275}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - MGZN JO - IEEE Design and Test of Computers TI - Test Resource Partitioning for SOCs IS - 5 SN - 0740-7475 SP80 EP91 EPD - 80-91 A1 - Anshuman Chandra, A1 - Krishnendu Chakrabarty, PY - 2001 VL - 18 JA - IEEE Design and Test of Computers ER -
A new test-resource-partitioning approach, based on test data compression and on-chip decompression, reduces data volume, decreases testing time, and accommodates slower (less expensive) testers without decreasing test quality.
Citation:
Anshuman Chandra, Krishnendu Chakrabarty, "Test Resource Partitioning for SOCs," IEEE Design and Test of Computers, vol. 18, no. 5, pp. 80-91, Sep/Oct, 2001
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