Pranab K. Nag, Anne Gattiker, Sichao Wei, R.D. Blanton, Wojciech Maly, "Modeling the Economics of Testing: A DFT Perspective," IEEE Design and Test of Computers, vol. 19, no. 1, pp. 29-41, January/February, 2002.

@article{ 10.1109/54.980051,
author = {Pranab K. Nag and Anne Gattiker and Sichao Wei and R.D. Blanton and Wojciech Maly},
title = {Modeling the Economics of Testing: A DFT Perspective},
journal ={IEEE Design and Test of Computers},
volume = {19},
number = {1},
issn = {0740-7475},
year = {2002},
pages = {29-41},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.980051},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - MGZN
JO - IEEE Design and Test of Computers
TI - Modeling the Economics of Testing: A DFT Perspective
IS - 1
SN - 0740-7475
SP29
EP41
EPD - 29-41
A1 - Pranab K. Nag,
A1 - Anne Gattiker,
A1 - Sichao Wei,
A1 - R.D. Blanton,
A1 - Wojciech Maly,
PY - 2002
VL - 19
JA - IEEE Design and Test of Computers
ER -