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Test Pattern Optimization using Proper Seed Selection in Mixed-Mode Technique

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2006.86

Third IEEE International Workshop on ...

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	ASCII Text	x
	Syed Zahidul Islam, Mohd. Alauddin Mohd. Ali, "Test Pattern Optimization using Proper Seed Selection in Mixed-Mode Technique," Electronic Design, Test and Applications, IEEE International Workshop on, vol. 0, no. 0, pp. 105-112, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006.

	BibTex	x
	@article{ 10.1109/DELTA.2006.86, author = {Syed Zahidul Islam and Mohd. Alauddin Mohd. Ali}, title = {Test Pattern Optimization using Proper Seed Selection in Mixed-Mode Technique}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2006}, isbn = {}, pages = {105-112}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2006.86}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Test Pattern Optimization using Proper Seed Selection in Mixed-Mode Technique SN - SP105 EP112 A1 - Syed Zahidul Islam, A1 - Mohd. Alauddin Mohd. Ali, PY - 2006 KW - null VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

Syed Zahidul Islam, Swinburne University of Technology, Sarawak, Malaysia

Mohd. Alauddin Mohd. Ali, Universiti Kebangsaan Malaysia (UKM), Malaysia

This paper presents a test pattern optimization approach using a proper number of seed selection in mixed-mode patterns. In mixed-mode patterns, the test set is assembled from LFSR based pseudorandom and deterministic patterns. The efficiency of this approach is largely determined by the ratio of those test patterns in the final test. The experiment results show that the total number of patterns in this optimized mixed-mode is minimized compared to conventional mixed-mode technique.

Citation:

Syed Zahidul Islam, Mohd. Alauddin Mohd. Ali, "Test Pattern Optimization using Proper Seed Selection in Mixed-Mode Technique," delta,pp.105-112, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006

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