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Application Profiles for Learning

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICALT.2006.77

Sixth IEEE International Conference o ...

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	ASCII Text	x
	Erik Duval, Neil Smith, Marc Van Coillie, "Application Profiles for Learning," Advanced Learning Technologies, IEEE International Conference on, vol. 0, no. 0, pp. 242-246, Sixth IEEE International Conference on Advanced Learning Technologies (ICALT'06), 2006.

	BibTex	x
	@article{ 10.1109/ICALT.2006.77, author = {Erik Duval and Neil Smith and Marc Van Coillie}, title = {Application Profiles for Learning}, journal ={Advanced Learning Technologies, IEEE International Conference on}, volume = {0}, year = {2006}, isbn = {}, pages = {242-246}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICALT.2006.77}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Advanced Learning Technologies, IEEE International Conference on TI - Application Profiles for Learning SN - SP242 EP246 A1 - Erik Duval, A1 - Neil Smith, A1 - Marc Van Coillie, PY - 2006 KW - null VL - 0 JA - Advanced Learning Technologies, IEEE International Conference on ER -

Erik Duval, Katholieke Universiteit Leuven

Neil Smith, Knowledge Integration, Ltd.

Marc Van Coillie, Eifel

Application profiles enable "mixing and matching" metadata elements, in order to meet specific requirements for a particular context. As an example, some communities may want to make certain elements mandatory or restrict the value space of a particular element.

However, there is much confusion and only limited experience and expertise in the development and deployment of application profiles. That is why the CEN/ISSS Learning Technologies Workshop has decided to develop guidelines on the use of application profiles for (e-)learning. This paper highlights the main results of this work, and was co-authored by the three experts that drafted the CEN document [4].

Citation:

Erik Duval, Neil Smith, Marc Van Coillie, "Application Profiles for Learning," icalt,pp.242-246, Sixth IEEE International Conference on Advanced Learning Technologies (ICALT'06), 2006

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