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Published Articles >> Table of Contents >> Abstract
8th International Conference on VLSI Design
p. 99
Generation of search state equivalence for automatic test pattern generation
Xinghao Chen, CAIP Center, Rutgers Univ., Piscataway, NJ, USA
M.L. Bushnell, CAIP Center, Rutgers Univ., Piscataway, NJ, USA
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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICVD.1995.512085
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| Abstract |
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We present a generalization of the equivalent search state (EST) approach for test generation. A search state represents the current search status based on prior search decisions. The generalized EST identifies 56% more previously-searched decision spaces than its predecessor on the 1985 ISCAS benchmarks. We present the enabling theorem with a proof, results and an example for sequential circuit test generation.
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 Additional Information
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Index Terms- search problems; automatic testing; logic testing; sequential circuits; integrated circuit testing; search state equivalence; automatic test pattern generation; current search status; prior search decisions; previously-searched decision spaces; enabling theorem; sequential circuit test generation
Citation:
Xinghao Chen, M.L. Bushnell,
"Generation of search state equivalence for automatic test pattern generation,"
vlsid,
p. 99,
8th International Conference on VLSI Design,
1995
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