Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
CrossRef Search
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
You requested this document:
1. Location-based compromise-tolerant security mechanisms for wireless sensor networks
Yanchao Zhang; Wei Liu; Wenjing Lou; Yuguang Fang;
Selected Areas in Communications, IEEE Journal on
Volume 24,  Issue 2,  Feb. 2006 Page(s):247 - 260
Abstract:

Node compromise is a serious threat to wireless sensor networks deployed in unattended and hostile environments. To mitigate the impact of compromised nodes, we propose a suite of location-based compromise-tolerant security mechanisms. Based on a new cryptographic concept called pairing, we propose the notion of location-based keys (LBKs) by binding private keys of individual nodes to both their IDs and geographic locations. We then develop an LBK-based neighborhood authentication scheme to localize the impact of compromised nodes to their vicinity. We also present efficient approaches to establish a shared key between any two network nodes. In contrast to previous key establishment solutions, our approaches feature nearly perfect resilience to node compromise, low communication and computation overhead, low memory requirements, and high network scalability. Moreover, we demonstrate the efficacy of LBKs in counteracting several notorious attacks against sensor networks such as the Sybil attack, the identity replication attack, and wormhole and sinkhole attacks. Finally, we propose a location-based threshold-endorsement scheme, called LTE, to thwart the infamous bogus data injection attack, in which adversaries inject lots of bogus data into the network. The utility of LTE in achieving remarkable energy savings is validated by detailed performance evaluation.
Abstract | Full Text: PDF(560 KB)    IEEE JNL
 
» Key
IEEE JNL IEEE Journal or Magazine
IEE JNL IEE Journal or Magazine
IEEE CNF IEEE Conference Proceeding
IEE CNF IEE Conference Proceeding
IEEE STD IEEE Standard
 
 
Indexed by IEE Inspec
© Copyright 2008 IEEE – All Rights Reserved