IEEE Transactions on Pattern Analysis and Machine Intelligence cover image for year 2003 issue number 03

IEEE Transactions on Pattern Analysis and Machine Intelligence

Outlier Modeling in Image Matching

Mar. 2003, pp. 301-315, vol. 25

DOI Bookmark: 10.1109/TPAMI.2003.1182094

Authors

David Hasler, IEEE
Luciano Sbaiz
Sabine Süsstrunk
Martin Vetterli, IEEE

Keywords

Outlier Model, Outlier Rejection, Mixture Model, Robust Pose Estimation, M Estimators

Abstract