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1999 17TH IEEE VLSI Test Symposium   p. 446
Low-Cost On-Line Test for Digital Filters
Ismet Bayraktaroglu, University of California at San Diego
Alex Orailoglu, University of California at San Diego

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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1999.766702
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Abstract
A low-cost on-line test scheme for digital filters is proposed. The scheme uses an invariant of the digital filter, the frequency response at specific points, in order to detect possible malfunctioning of the circuit. The analysis performed indicates that 100% fault secureness is possible, if certain design constraints are followed.
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Citation:  Ismet Bayraktaroglu, Alex Orailoglu, "Low-Cost On-Line Test for Digital Filters," vts, p. 446,  1999 17TH IEEE VLSI Test Symposium,  1999