Zhixi Yang, Sch. of Mechatronics and Automation, National University of Defense Technology, Changsha, Hunan, China Jie Han, Dept. of Electrical and Computer Engineering, University of Alberta, Edmonton, Canada Fabrizio Lombardi, Dept. of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA
It is shown that the abstracting of sensitivity feature is not only a conversion from quantity into quality, but also can be described by Qualitative Mapping, and wavelet transformation can be defined by qualitative mapping.