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Proceedings
DATE
DATE 2008
Design, Automation & Test in Europe. DATE'08
Panel Session - Caution Ahead: The Road to Design and Manufacturing at 32 and 22 nm
Year: 2008, Pages: 510-510
DOI Bookmark:
10.1109/DATE.2008.4484732
Authors
S Turnoy
,
Synopsys, USA
P Wintermayr
,
Elektronik.net, Germany
R Aitken
,
ARM, USA
R Lauwereins
,
IMEC, Belgium
J Tracy Weed
,
Synopsys, USA
V Kiefer
,
Qimonda, Germany
J Hartmann
,
STMicroelectronics, France
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