Cellular Automata Based Test Structures with Logic Folding

Biplab K. Sikdar; Sukanta Das; Samir Roy; Niloy Ganguly; Debesh K. Das

doi:10.1109/ICVD.2005.63

VLSI Design, International Conference on

Cellular Automata Based Test Structures with Logic Folding

Year: 2005, Pages: 71-74

DOI Bookmark: 10.1109/ICVD.2005.63

Authors

Biplab K. Sikdar, Bengal Engineering and Science University
Sukanta Das, Bengal Engineering and Science University
Samir Roy, Kalyani Government Engineering College
Niloy Ganguly, Technical University Dresden
Debesh K. Das, Jadavpur University

Abstract

This paper presents an efficient test solution for VLSI circuits. The test structure is designed with GF(2^P) CA. The introduction to an innovative scheme of logic folding optimizes the cost of test logic that can not be feasible with the flattened structure of GF(2) CA/LFSR.

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Cellular Automata Based Test Structures with Logic Folding

Authors

Abstract

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