2020 IEEE 38th VLSI Test Symposium (VTS)
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Abstract

While a number of methods exist for asynchronous circuit synthesis, there are limited applicable test methodologies. This paper presents a Built-In Self-Test (BIST) method for Multi-Threshold NULL Convention Logic (MTNCL) asynchronous circuits, which utilizes standard synchronous tools, and is automated to achieve maximum fault coverage while minimizing area overhead and test time.
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