Proceedings of the Fifth Asian Test Symposium (ATS'96)
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Abstract

On-line testing is a basic issue of any concurrent fault-tolerance policy. Error localisation within the neural network is necessary to provide information for hardware reconfiguration in order to achieve the system survival. In this paper, a concurrent approach for error localisation in digital neural networks is discussed and evaluated. Two techniques are applied: concurrent diagnosis with the use of data coding for error detection at neuron level and on-line localisation of the faulty neuron within the network.
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