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Proceedings
VTS
VTS 2017
2017 IEEE 35th VLSI Test Symposium (VTS)
Innovative practices session 10B innovative practices in Asia-2: From cost perspective
Year: 2017, Pages: 1-1
DOI Bookmark:
10.1109/VTS.2017.7928957
Authors
Kazumi Hatayama
,
Gunma University, Japan
Masahiro Ishida
,
Advantest, Japan
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Abstract
Start of the above-titled section of the conference proceedings record.