2012 IEEE 30th International Conference on Computer Design (ICCD 2012)
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Abstract

Emerging Resistive Random Access Memories (RRAM) devices are an attractive option for future memory architectures due to their low-power and high density. However, their capacity is limited by sneak paths and the sensitivity of the sense amplifiers (SA). We develop a framework to maximize the capacity of RRAM memories by modeling the interactions between memory capacity, sneak paths, device parameters, and the sense amplifier. The framework explores the design space of the memory by considering different read/write mechanisms, sneak path elimination techniques, and multi-level storage.
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