OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters

Daniel Arbet; Gábor Gyepes; Juraj Brenkuš; Viera Stopjaková

doi:10.1109/DDECS.2012.6219053

2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters

Year: 2012, Pages: 193-194

DOI Bookmark: 10.1109/DDECS.2012.6219053

Authors

Daniel Arbet, Institute of Electronics and Photonics, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia
Gábor Gyepes, Institute of Electronics and Photonics, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia
Juraj Brenkuš, Institute of Electronics and Photonics, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia
Viera Stopjaková, Institute of Electronics and Photonics, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovakia

Abstract

This paper deals with the comparison of the fault coverage of catastrophic faults in active analog integrated filter obtained by the measurement of filter parameters and by the Oscillation-based Built-In Self Test (OBIST) approach. In our experiment, firstly, the cut-off frequency, ripple in the pass band, DC gain in pass band and group delay of the filters have been monitored in the operating mode. Then, during the test mode (OBIST), the filter is transformed to an oscillator, and the oscillation frequency is compared to the frequency from a dedicated on-chip reference oscillator to compensate undesired influence of technology variations. The obtained results on the efficiency of both approaches are compared.

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OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters

Authors

Abstract

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