IEEE International Conference on Test, 2005.
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Abstract

The Philips RTO7 chip consists of a complete receive chain from RF up to and including digital demodulation for Bluetooth-like radio communication. This paper describes both the implementation and verification of the test and debugs hardware for the digital core of the RTO7. The core-based DfT and DfD flow of the RTO7 is presented. The experimental results show that the RTO7 is both a fully testable and debuggable chip. State dump analysis results are also presented, showing that the state dumps obtained in the application are 100% stable, and match the state dumps made in simulation, and on the digital test system.
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