2014 IEEE 32nd VLSI Test Symposium (VTS)
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Abstract

Infrequent errors, such as unwanted glitches occurring once every a few seconds in silicon tuners, are very costly to capture in production due to long test time by the nature of the errors. The paper presents a novel scheme that reduces the test time from a few seconds to a few tens milliseconds. The scheme has been implemented to test millions of silicon TV tuners, and field defects caused by the glitches were successfully eliminated.
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