Abstract
Field Programmable Gate Arrays (FPGAs) are designed and fabricated using the most advanced CMOS technology nodes to meet performance and power demands. This makes them susceptible to many manufacturing and reliability challenges. Increasing chip temperature is a major reliability concern since various failure mechanisms are accelerated at high chip temperature, which require thermal-aware testing to detect them. External devices like thermal chambers are usually used to heat up the chip to a desired temperature in order to apply the test. However, there are many limitations for these external devices, which make the thermal-aware testing of the FPGA a challenging process. In this paper, a self-heating approach for thermal-aware testing of FPGAs is presented, in which the internal resources of FPGA are used to build controlled self-heating elements (SHEs). These controlled SHEs are distributed across the FPGA and integrated with the built-in self-test (BIST) scheme to generate the required temperature profile for testing. Thus, no external devices for heating up the FPGA are needed. The experimental results show that a wide range of maximum chip temperatures can be achieved (from 50°C up to 125°C on Virtex-5 FPGA) with a high accuracy (±1°C).