Abstract
Recent analog designers do think about measurement at design time. Analog design-for-measurement is a real success, not based on test research but based on designers' incorporation of calibration methods to ensure that their circuits work within specifications. In the meantime, mixed-signal test research has not kept pace with new design architectures, and some analog designers have outpaced mixed-signal test/design-for-test researchers. This session will elucidate the key factors for this success and the differences between design and test. And the session will discusses a designers' and test researchers' roles on analog design-for-test from each viewpoint, and some challenges on collaborating designers and test researchers.