2018 IEEE 36th VLSI Test Symposium (VTS)
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Abstract

In this IP session, there will be 3 presentations focusing on functional testing and fault injection for automotive functional safety applications as well as a discussion on fault simulation and modeling for relevant analog test content. The 1st presentation will discuss verification solutions that accelerate fault injection for diagnostic coverage to meet ASIL requirements. The 2nd presentation discusses the use of focused random testing to achieve better functional coverage for automotive products. The 3rd presentation will discuss the various challenges associated with analog fault coverage in the absence of standards and discusses approaches to address them.
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